Yokogawa launches optical spectrum analysers covering wide wavelength range19 August 2022

Yokogawa has launched two new optical spectrum analyzers (OSAs) to fulfil market demands for an instrument capable of measuring a wide range of wavelengths to meet new needs in optical product development and manufacturing.

The Yokogawa AQ6375E and AQ6376E are the only grating-based OSAs covering SWIR (short-wavelength infrared) over 2 μm and MWIR (mid-wavelength infrared) over 3 μm with world class optical performance.

The new OSAs are offered in four versions. The AQ6375E Standard has a wavelength range of 1200-2400nm; the AQ6375E Extended Wavelength version has a wavelength range of 1000-2500nm; the AQ6375E Limited version has a wavelength range of 1200-2400nm (with reduced wavelength resolution); and the AQ6376E Standard has a wavelength range of 1500-3400nm.

The choice of wavelengths available gives developers increased flexibility to apply the OSAs in a wide range of applications. These include environmental measurement and gas sensing, where the AQ637xE can be used in the measurement of gas absorption spectra and the characterization of light sources used in Laser Absorption Spectroscopy. Other major uses for the new OSAs are medical care and biotechnology and industrial laser applications.

Typical applications will include the development and measurement of lasers; the characterization of broadband light sources such as supercontinuum light sources; optical passive devices; and optical fibers.

To analyze results, the AQ637xE has built-in analysis functions to characterize optical spectrum from a variety of optical systems and devices, such as WDM system, DFB-LD, EDFA, and filters.

Analysis functions include: DFB-LD; FP-LD; LED; Spectral width (peak/notch); SMSR; Optical power; WDM (OSNR); EDFA (Gain and NF); Filter (peak/bottom) and WDM filter (peak/bottom).

To improve measurement efficiency and productivity, the AQ637xE features an application (APP) mode, transforming a versatile OSA into a machine dedicated to a device under test (DUT).

Operations Engineer

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Yokogawa UK Ltd

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